Welcome to the repository for the paper titled "VoiceAgentEval: A Dual-Dimensional Benchmark for Expert-Level Intelligent Voice-Agent Evaluation of xbench's Professional-Aligned Series". Initiated by Meituan, and supported by the xbench Project Team, this work proposes VoiceAgentEval, a comprehensive benchmark for evaluating large language models (LLMs) in expert-level intelligent outbound ...
ign of agent work pipelines and from agents trained end-to-end in real-world environments. This paper focuses on the evaluation of vertical agents and the tracking of their productivity value scaling. We will continuously collect evaluation results for vertical agents to observe and track the characterist
Ion-abrasion SEM (IA-SEM) is a method of nanoscale 3D imaging that uses a focused beam of gallium to repeatedly abrade the specimen surface 20 nanometres at a time.
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Scanning Electron Microscope (SEM) is a type of electron microscope that scans surfaces of microorganisms that uses a beam of electrons moving at low energy to focus and scan specimens.
Scanning electron microscopy (SEM) is one of the most popular and widely used techniques for the characterization of nanomaterials and nanostructures. With a magnification range of 10 to over 300,000, SEM can properly analyze specimens down to a resolution of a few nanometers.
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The scanning electron microscope (SEM), in which a beam of electrons is scanned over the surface of a solid object, is used to build up an image of the details of the surface structure.